Enhanced Characterization Techniques Across Wafer, Cell, and Module Production Lines

Thursday, June 20, 2024

Time
01:00 pm - 02:30 pm
Hall
Messe München
Room
Hall A2, Booth A2.409

Quality assurance in wafer, cell, and module production hinges on efficient characterization processes. Precise measurements and identification of defective products are crucial for cost savings. Characterization enhances throughput and facilitate sorting based on performance metrics, making advancements in software and automation solutions imperative. Machine learning and digitalization play key roles in bolstering the robustness and efficiency of production lines and are widely adopted within the industry. In this session, companies will provide the latest advancements in the realm, while others will showcase how they track the quality of their products. The topic of quality assurance through tracked metrology will be discussed.

01:00 pm - 02:30 pmEnhanced Characterization Techniques Across Wafer, Cell, and Module Production Lines

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