Quality control on wafer, cell and module production lines depends on effective characterization. Being able to perform accurate measurements and sorting out any defective products saves costs. Characterization is done through imaging techniques such as infrared, photoluminescence, electroluminescence, and efficiency is determined by current-voltage measurements. We need advancements in software and automation solutions to increase throughput and enable sorting according to performance value. Machine learning and digitalization are widely implemented to make production lines robust and efficient.
Mr. Matthias Krinke, Geschäftsführender Gesellschafter, pi4 robotics GmbH
Dr. Klaus Ramspeck, Director R&D, halm elektronik gmbh
Dr. Michael Fuß, CEO, MBJ Solutions GmbH
Mr. Gary Young, Head of Sales, Vitronic Dr. Ing. Stein Bildverarbeitungs-GmbH
Mr. Magdi El-Awdan, Senior Manager, Siemens AG, Germany
Mr. Heinz-Josef Lennartz, Senior Manager, Siemens AG, Germany
Mr. Bernhard Mitchell, Lead Innovation Management, WAVELABS Solar Metrology Systems GmbH
Mr. Peter Handschack, Managing Director, ISRA VISION GmbH, Germany