Quality control on wafer, cell and module production lines depends on effective characterization. Being able to perform accurate measurements and sorting out any defective products saves costs. Characterization is done through imaging techniques such as infrared, photoluminescence, electroluminescence, and efficiency is determined by current-voltage measurements. We need advancements in software and automation solutions to increase throughput and enable sorting according to performance value. Machine learning and digitalization are widely implemented to make production lines robust and efficient.